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Function
Charged-particle tracking, beam transport and electron/ion gun design
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Description
Trak 7.0 is the most advanced 2D code available on any computer platform for
charged-particle optics and gun design. The program applies high-accuracy
finite-element techniques to calculate single-particle orbits or to simulate
steady-state beams in 2D (planar or cylindrical) electric and magnetic fields.
Features include effects of beam-generated electric and magnetic fields,
automatic generation of input distributions, self-consistent space-charge-
limited emission, and field emission. Applications include electron and ion
guns, electro-optical devices, electron microscopes, vacuum microelectronics and
relativistic high-power beams. (Requires Mesh 6.0, EStat 6.0 and PerMag 6.0.)
Features
 Easy-to-understand
instruction manual with a library of read-to-run examples.
Combine effects of
calculated electric and magnetic fields on independent meshes.
Self-consistent space-charge-limited emission from multiple sources.
High accuracy orbit
calculations, even near electrode surfaces
Precision
interpolation to stopping planes for lens characterization.
Interactive orbit and
field plotting postprocessor with built-in hardcopy
support.
Automatic calculation of self-consistent plasma surfaces for ion extraction.
Advanced secondary-
emission models and automatic tracking of multi-generational electron
histories.
Automatic calculations
of emittance and current density.
Formatted text output
files make it easy to transfer information to user applications or to
mathematical analysis programs.
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