Field Precision title

Trak screenshots, charged particle beam physics

For more information
Download the Trak instruction manual: trak.pdf
Reprint, new plasma-surface capability: modeling_ion_extraction.pdf
Get information on Mesh: mesh.html
Get information on EStat: estat.html
Get information on PerMag: permag.html
Download the GenDist Manual: gendist.pdf
Contact us if you have a question: techinfo@fieldp.com
Trak Charged Particle Toolkit

Function
Charged-particle tracking, beam transport and electron/ion gun design

Description
The Trak Charged Particle Toolkit is the most advanced 2D code available on any computer platform for charged-particle optics and gun design. The program applies high-accuracy finite-element techniques to calculate single-particle orbits or to simulate steady-state beams in 2D (planar or cylindrical) electric and magnetic fields. Features include effects of beam-generated electric and magnetic fields, automatic generation of input distributions, self-consistent space-charge-limited emission, and field emission. Applications include electron and ion guns, electro-optical devices, electron microscopes, vacuum microelectronics and relativistic high-power beams. The package includes five linked components: Mesh (automatically create conformal triangular meshes), EStat (electric-field solutions, plots and analysis), PerMag (magnetic-field solutions, plots and analysis) and Trak (calculate trajectories and regenerate fields, plots and analysis) and GenDist (plots and analysis of particle distributions).

Features
Easy-to-understand instruction manual with a library of read-to-run examples.
Combine effects of calculated electric and magnetic fields on independent meshes.
Self-consistent space-charge-limited emission from multiple sources.
High accuracy orbit calculations, even near electrode surfaces
Precision interpolation to stopping planes for lens characterization.
Interactive orbit and field plotting postprocessor with built-in hardcopy support.
Automatic calculation of self-consistent plasma surfaces for ion extraction.
Advanced secondary- emission models and automatic tracking of multi-generational electron histories.
Automatic calculations of emittance and current density.
Formatted text output files make it easy to transfer information to user applications or to mathematical analysis programs.

Price
Complete and self-contained Trak Charged Particle Toolkit package for 2D simulations of electric fields, magnetic fields and charged-particle beams. Single-user license includes free updates. Electronic delivery of order and updates with no shipping or handling charges. The Basic package runs on 32 or 64 bit machines with Internet license management. The Professional package, a 64 bit compilation with unlimited memory access and parallel-processing support, has an autonomous license for defense laboratories and other secure installations.

Basic (TK0400): $1,490.00
Professional (TK0450): $2,490.00

Purchase
Contact us by E mail or telephone (1-505-220-3975) to request a free trial of the Trak Charged Particle Toolkit. Organizations may send a purchase order (net 30) by E mail to techinfo@fieldp.com. To place a credit card order, call us at 1-505-220-3975 or use the buttons below. Orders are fulfilled via electronic download within 24 hours. The prices refer to a single-user license (simultaneous activation of two computers) with free updates. There are no shipping or handling charges. Contact us for information on educational and site licenses discounts.

Customers in Japan, contact Advanced Science Laboratory Inc..